Embedded systems and mobile devices often include low-level debugging ports—such as UART, JTAG, SPI, USB, and I²C—that facilitate development and in-field diagnostics. 

When left enabled or improperly secured, these interfaces provide attackers with direct hardware access, allowing them to extract firmware, bypass protections, or inject malicious code. 

Exposed Debugging Interfaces Security Testing evaluates whether your devices’ debug ports are appropriately disabled, authenticated, or guarded, preventing hardware-level compromises.

Tests Performed in Exposed Debugging Interfaces Assessments

UART (Universal Asynchronous Receiver/Transmitter)
 We inspect serial console outputs and input prompts exposed over UART lines. Unprotected UART ports often reveal bootloader prompts, console menus, or raw shell access—allowing attackers to dump memory, alter firmware settings, or escalate privileges.

JTAG (Joint Test Action Group)
 This test attempts to connect to the device’s JTAG boundary-scan interface to read/write memory, halt execution, or step through instructions. We verify that JTAG is disabled or locked down in production builds, and that any enablement requires robust authentication mechanisms.

SPI (Serial Peripheral Interface)
 We probe the SPI bus to intercept flash or EEPROM communication between the CPU and storage chips. By analyzing or injecting SPI traffic, attackers can extract firmware binaries, modify code in situ, or inject malicious payloads before boot.

USB Debugging
 This assessment checks for enabled USB debug modes (e.g., Android ADB, proprietary vendor interfaces) that grant shell access or firmware flashing capabilities. We ensure that USB debugging requires explicit user consent, authentication, or physical locks to prevent unauthorized connections.

I²C (Inter-Integrated Circuit)
 We evaluate I²C buses, which often carry sensor data or configuration commands. Attackers with physical access can manipulate I²C lines to trigger unintended behavior, read secret keys from secure elements, or cause malfunctions in critical subsystems.